Instructor:

Prof. Gordon W. Roberts, ENGMC Rm 516

Lecture Times:

Tuesday      8:35 am - 9:55 am, SHER451

Thursday     8:35 am - 9:55 am, SHER451

Tutorial Times:

None scheduled nor provided

Course Outline:

Students will learn about digital sampling techniques to perform analog parametric testing, including frequency response, harmonic and inter-modulation distortion, and noise behavior of mixed-signal circuits and systems. This will be applied to analog, sampled-data, RF and High-Speed digital channels. DSP-basics, such as sampling, windowing and frequency transforms (DFT and FFT) will be described. Coherent versus non-coherent type measurements will also be discussed, as well as the M/N sampling principle. Test interfacing will also be described in terms of how to build a printed circuit board for test purposes. Students will work with an advanced mixed-signal production tester (Teradyne Flex) and a National Instruments myDAQ mixed-signal instrument.

Additional Information:

(1) textbooks   (2) grading

(3) academic integrity (4) language of course